Faster submicron-resolution imaging of intact samples
ZEISS introduces two new advanced models of the ZEISS Xradia Versa family. The ZEISS Xradia 610 & 620 Versa X-ray microscopes excel through faster non-destructive imaging of intact samples without sacrificing resolution and contrast over the full range of power and kV.
Leading researchers and scientists across the world rely on the signature Resolution at a distance (RaaD) capability of ZEISS X-ray Versa microscopes, ensuring the highest resolution is maintained across longer working distances, to produce remarkable scientific insights and discoveries. The rapid rate of technology advancements today requires fast analytical instruments that can keep up the pace. The ZEISS Xradia 600-series Versa is designed for this challenge.
ZEISS Xradia 610 & 620 Versa with improved source and optics technology
The two biggest challenges in X-ray computed tomography are maintaining resolution on large sample sizes and with long working distances while simultaneously maximizing resolution and X-ray flux for greater throughput. Both instruments address these challenges: They provide a high-power X-ray source for significantly higher X-ray flux. This leads to faster tomography scans and therefore up to two times higher throughput—without compromising spatial resolution. At the same time, the X-ray source stability and lifetime is enhanced.
Key features include:
- 500 nm spatial resolution, 40 nm min voxel size
- Up to 2x higher throughput than ZEISS Xradia 500-series Versa
- Improved ease of use, including fast-activation source control
- Ability to observe submicron features on the broadest range of sample types and sizes and for longer working distances