Faster submicron-resolution imaging of intact samples
ZEISS introduces two new advanced models of the ZEISS Xradia Versa family. The ZEISS Xradia 610 & 620 Versa X-ray microscopes excel through faster non-destructive imaging of intact samples without sacrificing resolution and contrast over the full range of power and kV.
Leading researchers and scientists across the world rely on the signature Resolution at a distance (RaaD) capability of ZEISS X-ray Versa microscopes, ensuring the highest resolution is maintained across longer working distances, to produce remarkable scientific insights and discoveries. The rapid rate of technology advancements today requires fast analytical instruments that can keep up the pace. The ZEISS Xradia 600-series Versa is designed for this challenge.