Tag Archives: X-ray Microscopy

Xradia by ZEISS: All things X-ray microscopy

Live-Webinar: Battery Research with Advanced Microscopy and Image Processing

From Sample Preparation to 3D Reconstruction and Quantification

Battery Research

In this webinar Stefanie Freitag from ZEISS will first give an introduction about existing advanced microscopic techniques for battery research including the presentation of possibilities for in-situ observations. In the second part Dr. Jochen Joos from KIT will explain his established workflow from sample preparation to 3D reconstruction and describe hurdles and solutions concerning image processing.

Thursday, 21 March 2019 | 4 p.m. (CET)


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How can toothbrush and toothpaste be a perfect match?

APEER helps to analyze all imaging data and unveils new perspectives

Professor Ralf Wehrspohn, Director of the Fraunhofer Institute for Microstructure of Materials and Systems IMWS

Researchers at the Fraunhofer Institute for Microstructure of Materials and Systems IMWS in the German city of Halle investigate the interactions between teeth and various dental care products. With APEER they can now analyze and correlate all data and gain new insights.


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The next generation X-ray microscopes: ZEISS Xradia 600-series Versa introduced

Faster submicron-resolution imaging of intact samples

Smartphone analysis with ZEISS Xradia 600-series Versa

ZEISS introduces two new advanced models of the ZEISS Xradia Versa family. The ZEISS Xradia 610 & 620 Versa X-ray microscopes excel through faster non-destructive imaging of intact samples without sacrificing resolution and contrast over the full range of power and kV.

Leading researchers and scientists across the world rely on the signature Resolution at a distance (RaaD) capability of ZEISS X-ray Versa microscopes, ensuring the highest resolution is maintained across longer working distances, to produce remarkable scientific insights and discoveries. The rapid rate of technology advancements today requires fast analytical instruments that can keep up the pace. The ZEISS Xradia 600-series Versa is designed for this challenge.


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Rice Rice Baby!

Agricultural research using X-ray microscopy

imaging result of rice flower

In order to identify the structural differences between rice varieties and different parts, microscopic observation is necessary. ZEISS X-ray microscopy enables researchers to observe the inner structure with a 3D non-destructive method, which provides a new tool for rice and other agricultural research. In order to develop the application of X-ray microscopy with rice, the Shanghai Institute of Plant Physiology and Ecology, SIBS, CAS and ZEISS cooperated on the imaging study of rice samples.


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Push the boundaries – upgrade your microscope

Additional functionality, improved performance or extended lifetime

Upgrade_microscope

Demanding imaging tasks require to make the most of your valuable ZEISS system. Additionally, the questions you are asking develop and change over time.
Watch the video and discover how your highly modular ZEISS system can grow with your needs. See how upgrades and updates give you additional functionality, improved performance and extended lifetime.


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“I am impressed time and again by the many applications of microscopy”

Anita_Sonnenfroh_ZEISS_Iberia

Anita Sonnenfroh is heading the ZEISS sales and service company in Iberia, which brings together the Microscopy, Industrial Metrology and Medical Technology business groups.

Her many experiences over the years and numerous extraordinary moments have caused her fascination for microscopy to grow. Read the interview here:

How ZEISS microscopes support chip manufacturers

Looking inside structures of failed devices and finding out why they failed

Chip-manufacturers_Circuit-board_3

ZEISS light, electron and ion microscopes are used throughout the manufacturing process for 2D and 3D surface imaging, to measure volumes just as well as linear dimensions or cross sections. Another common use for 3D imaging is failure analysis. Chip manufacturers use ZEISS technology to look inside structures of failed devices for clues to why they failed, helping to create more stable and reliable products for the future.


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Science and ZEISS present webinar on new methods for characterizing nanostructures

Exploring advances in high-resolution and in situ imaging

During the webinar, the speakers will:

  • Review the latest advances in nanoscale 3D printed lattice structures
  • Present their own work involving SEM and HIM imaging methods to characterize nanolattice structures.
  • Describe the use of nondestructive 3D X-ray imaging methods
  • Discuss future directions for in situ imaging
  • Answer questions during the live broadcast!


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ZEISS Microscopy Customer Center Tokyo reopened

Experiencing the broad spectrum of ZEISS microscopes

Following expansion and renovation, the ZEISS Microscopy Customer Center Tokyo reopened in April 2018. Around 45 customers from industry and academia attended the grand ceremony. Dr. Kaoru Sato from JFE Techno-Research Corporation, one of Japan’s most well versed experts in electron microscopy, expressed his future expectations for ZEISS in a speech. After the ribbon-cutting ceremony, ZEISS offered tours of the center.


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