News

A new way of FIB-processing

Creating TEM lamellae with the new Ion-sculptor FIB column of ZEISS Crossbeam

The Ion-sculptor FIB column of the ZEISS Crossbeam FIB-SEM introduces a new way of FIB-processing. By minimizing sample damage you’ll maximize sample quality and perform experiments faster at the same time. When preparing TEM lamellae use the low voltage capabilities of the Ion-sculptor FIB: get ultra-thin samples while keeping amorphization damage at a minimum.


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The amazing world of nature’s hidden life

Stereo microscopes for Eden Project in Cornwall

Under a shining cluster of gigantic bubbles in Cornwall perhaps the most important garden in the world is growing. The newest addition to the Eden Project is the Invisible Worlds exhibition. Providing insights into the segmentation of a millipede to the multiple lenses of a fly’s eye, ZEISS stereo microscopes are an invaluable resource for the narrators, as well as a wonderful experience for visitors.


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Deciphering the story of the solar system

Research reveals meteorites found in Sudan in 2008 are remnants of lost planet

Using ZEISS FIB-SEM technology, Swiss, French, and German scientists observed fragments of a meteorite that crashed into Earth more than a decade ago. They discovered it contained tiny gems that formed deep inside a lost planet from the early days of the solar system at least 4.55 billion years ago.


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ZEISS Microscopy Customer Center Tokyo reopened

Experiencing the broad spectrum of ZEISS microscopes

Following expansion and renovation, the ZEISS Microscopy Customer Center Tokyo reopened in April 2018. Around 45 customers from industry and academia attended the grand ceremony. Dr. Kaoru Sato from JFE Techno-Research Corporation, one of Japan’s most well versed experts in electron microscopy, expressed his future expectations for ZEISS in a speech. After the ribbon-cutting ceremony, ZEISS offered tours of the center.


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Connecting information across dimensions with the new ZEISS ZEN Connect imaging software

Experience seamless data handling, simplified workflows and enriched insights into your samples

ZEISS ZEN Connect is especially useful for, but not limited to, structural analysis, examination of cellular processes, localization of cells, and much more. The proven ZEISS ZEN software combines numerous functions for day-to-day work with microscopes and stands for scientific success. The ZEISS ZEN Connect module enhances research by introducing three new features.


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ZEISS invites to Day of Microscopy in Oberkochen, Germany

Focus on the latest microscopy techniques and a wide range of applications

ZEISS will host the Day of Microscopy at the ZEISS Forum and ZEISS Microscopy Customer Centre Europe in Oberkochen on May 16 and 17, 2018. International guests from research, science and industry can expect a varied program of lectures, workshops and discussions that will give impressive applicative and technological insights into light, electron and X-ray microscopy at ZEISS. Keynotes from science and industry will take you into the world of tomorrow to demonstrate the broad scope of microscopy.


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Successful light sheet microscopy workshop in Geneva

The Wyss Center welcomed more than 100 participants

In March, the Wyss Center in Geneva was the site of ZEISS’ first joint workshop on the topic of light sheet fluorescence microscopy (LSFM). The aim of the workshop was to provide information on the different aspects of LSFM through various talks and encourage developers and users to share ideas. The event was nicely rounded off by hands-on sessions run by ZEISS and arivis.


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Official Opening of the APAC Support Center in Shanghai

Supporting customers in the Asia-Pacific region

The opening of the ZEISS Microscopy APAC Support Center (ASC) in Shanghai is another milestone for ZEISS Microscopy to enable and support customers in the increasingly important and growing APAC region. “We can only ensure sustainable growth if we’re in a position to deliver the services our customers need quickly and effectively,” says Alex Cheong, Regional Service Manager APAC for ZEISS Microscopy.


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Introducing a new X-ray micro-computed tomography (microCT) system

ZEISS Xradia Context microCT offers full context, large field of view, and high throughput imaging

ZEISS has now expanded its portfolio of lab X-ray imaging instruments with a new micro-computed tomography (microCT) system: ZEISS Xradia Context microCT will expand the offering with full context, large field of view, and high throughput imaging, while ZEISS Xradia Versa and Xradia Ultra X-ray microscopes will continue to address challenging 3D imaging problems, particularly when high-resolution needs are paramount. ZEISS Xradia Context microCT will enable users to image objects both large and small, addressing the broad range of computed tomography applications with a foundation built on the high performance and high data quality for which ZEISS Xradia has become known.


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