Events

Stay tuned and catch up with our virtual and real-life activities.

Insights from M&M 2019

Observations from a ZEISS executive leader on one of the largest microscopy conferences in the world

Allister McBride, Head of Materials Science at ZEISSat the ZEISS booth at M&M 2019

The annual Microscopy & Microanalysis (M&M) conference was recently held in Portland, Oregon, USA. ZEISS is one of the largest sponsors and exhibitors at this meeting for the Microscopy Society of America that is dedicated to the promotion and advancement of techniques and applications of microscopy and microanalysis in all relevant scientific disciplines.

In attendance was Allister McBride, a senior director at ZEISS who is responsible for materials research strategy. This includes understanding new trends in the market, translating those into customer needs, and working with R&D to create innovative solutions. Allister provided the commentary on what he felt were some of the more interesting new trends and topics at this year’s M&M.


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African Students Fascinated by the Possibilities of Confocal Microscopy

Microscopy and image analysis course at University of Ghana

The participants of the microscopy and image analysis course at University of Ghana showed a great level of enthusiasm.

Recently, the two-week course “Introduction to fluorescent microscopy and image analysis techniques” was held at the West African Centre for Cell Biology of Infectious Pathogens (WACCBIP) at University of Ghana at Legon. It helped 15 Master’s and PhD students from different universities in Ghana and Senegal gain a basic understanding of light microscopy techniques and computerized image analysis.


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Efficient Microstructure Characterization of Metals Using Light Microscopy

Your questions answered

Microstructure of Material

A material’s properties are strongly linked to its microstructure, such as grain size, porosity, phase and non-metallic inclusions. Light microscopy is a powerful tool for evaluating a material’s microstructure, but extracting meaningful results using traditional image analysis can be challenging.

In a recent SelectScience® webinar, Tim Schubert, materials scientists at the Materials Research Institute Aalen (IMFAA), Aalen University, and Torben Wulff, solutions manager light microscopy at ZEISS Research Microscopy Solutions, introduce a new comprehensive solution for microstructure analysis and present standardized techniques for metallography investigation.


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ZEISS Sponsors Traveling Exhibition Showcasing Extraordinary Images From Science

“Images from Science 3” explores interface of science, technology, art, design, and communication

Images from Science 3

ZEISS is sponsoring Images from Science 3, a traveling exhibition celebrating the world’s most extraordinary images and image makers who explore science. The project showcases the interface of science, technology, art, design, and communication.

The exhibition, a collaboration between Rochester Institute of Technology and Johns Hopkins University, will premier in late November 2019. Images from Science 3 will feature up to 75 extraordinary still and moving images that reveal science in new and unique ways. The images for inclusion will be selected by an international panel of experts.


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Science and ZEISS Present Webinar on New Methods for Characterizing Nanostructures

Exploring advances in high-resolution and in situ imaging

During the webinar, the speakers will:

  • Review the latest advances in nanoscale 3D printed lattice structures
  • Present their own work involving SEM and HIM imaging methods to characterize nanolattice structures.
  • Describe the use of nondestructive 3D X-ray imaging methods
  • Discuss future directions for in situ imaging
  • Answer questions during the live broadcast!


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Successful Light Sheet Microscopy Workshop in Geneva

The Wyss Center welcomed more than 100 participants

In March, the Wyss Center in Geneva was the site of ZEISS’ first joint workshop on the topic of light sheet fluorescence microscopy (LSFM). The aim of the workshop was to provide information on the different aspects of LSFM through various talks and encourage developers and users to share ideas. The event was nicely rounded off by hands-on sessions run by ZEISS and arivis.


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Free Workshop and Scientific Meeting on Correlative Microscopy: From 3D Light to 3D Electron Microscopy

ZEISS in Collaboration with VIB | 4th Meeting

ZEISS in collaboration with the BioImaging Core Facility at the VIB Ghent are proud to host this joint workshop and scientific meeting on Correlative Microscopy and volume SEM. The meeting is centered around scientific sessions covering a broad range of correlative microscopy and SEM methods including data management and analysis. In addition participants will have the opportunity to join instrument workshops and round table discussions.


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Free Webinar: Fully Integrated FESEM/AFM Solution for Plenary in Situ Characterization in Materials Science

When participating on this webinar, you will understand:

  • The fully integrated FESEM/AFM solution and its unique features
  • When to do in situ combination of FESEM and AFM?
  • What additional information you will get from the combination compared to standalone systems
  • How to work with the instrument


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Free Oil & Gas Webinar: Bursting the Bubble on Kerogen-Based Digital Rock Physics

Linking pore topography and topology using nanoscale 3D FIB-SEM and FIB-HIM imaging

In this webinar we will overview all the methodological requirements which lie behind producing high fidelity nano-scale images, before looking at how these techniques can be used to understand the differences between organic hosted pore structures seen in onshore economic US shale reservoirs and those seen in more conventional pore structures.

When: September 6th, 2017, 9:00 AM – 10:00 AM PST


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ZEISS at Microscopy & Microanalysis (M&M) 2017 in St. Louis, MO

Join ZEISS for our largest microscopy tradeshow in North America. Visit us at the 2017 Microscopy & Microanalysis conference to learn about the latest microscopy innovations and advancements through seminars in our booth. Test-drive our newest electron/ion and light microscopes. Challenge our team of experts with your most difficult imaging problems.


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