The Wyss Center welcomed more than 100 participants
In March, the Wyss Center in Geneva was the site of ZEISS’ first joint workshop on the topic of light sheet fluorescence microscopy (LSFM). The aim of the workshop was to provide information on the different aspects of LSFM through various talks and encourage developers and users to share ideas. The event was nicely rounded off by hands-on sessions run by ZEISS and arivis.
ZEISS in collaboration with the BioImaging Core Facility at the VIB Ghent are proud to host this joint workshop and scientific meeting on Correlative Microscopy and volume SEM. The meeting is centered around scientific sessions covering a broad range of correlative microscopy and SEM methods including data management and analysis. In addition participants will have the opportunity to join instrument workshops and round table discussions.
Linking pore topography and topology using nanoscale 3D FIB-SEM and FIB-HIM imaging
In this webinar we will overview all the methodological requirements which lie behind producing high fidelity nano-scale images, before looking at how these techniques can be used to understand the differences between organic hosted pore structures seen in onshore economic US shale reservoirs and those seen in more conventional pore structures.
Join ZEISS for our largest microscopy tradeshow in North America. Visit us at the 2017 Microscopy & Microanalysis conference to learn about the latest microscopy innovations and advancements through seminars in our booth. Test-drive our newest electron/ion and light microscopes. Challenge our team of experts with your most difficult imaging problems.
ZEISS impresses at EMC2016 with Crossbeam FIB-SEM technology and correlative microscopy solutions
The 16th European Microscopy Congress, EMC2016 gathered around 2500 visitors from 51 countries all over the world in Lyon, France. Along with an international and multidisciplinary high quality conference, EMC2016 hosted Europe’s largest exhibition dedicated to microscopy. The congress also offered a large number of training and scientific activities underlining the dynamism of French and European research.
Join ZEISS for our largest microscopy tradeshow in North America. Visit us at the 2016 Microscopy & Microanalysis conference to learn about the latest microscopy innovations and advancements through seminars in our booth. Test-drive our newest electron/ion and light microscopes. Challenge our team of experts with your most difficult imaging problems.
ZEISS presents Digital Classroom Experience at 11th Asia Pacific Microscopy Conference
At the 11th Asia Pacific Microscopy Conference in Phuket, Thailand, held from 24 – 27 May, ZEISS presented the “Digital Classroom Experience Zone” and organized scientific talks on confocal, focused ion beam, and helium ion microscopy by ZEISS experts. In addition, visitors at the ZEISS booth had the opportunity to explore virtual reality with a ZEISS VR ONE Virtual Reality Headset.
Learn about strategies for managing big image data and discover connectome research with the world’s fastest scanning electron microscope
ZEISS webinars facilitate knowledge about the newest technologies and applications in microscopy and digital imaging. With our webinars you stay ahead of the curve in research and industry, you are the first to learn about the newest technologies, and you discover how your applications benefit from ZEISS solutions.
With two upcoming webinars in November we are addressing the growing trend of generating and processing large amounts of imaging data in 2D and 3D with newest high-end microscopy systems from the meso- to the nanoscale, such as light sheet, Airyscan, or multi-beam scanning electron microscopy. Register today for free, take part in the discussion, and stay ahead of the curve with ZEISS!