White Papers detailing the advantages of ZEISS Crossbeam FIB-SEM technology
With ZEISS Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples.
This article highlights current applications of ZEISS Crossbeam technology for high-end nanofabrication, correlative nano-imaging, and advanced materials analysis. Download the White Papers as free pdf files and contact us for further questions via our website!