Creating TEM lamellae with the new Ion-sculptor FIB column of ZEISS Crossbeam
The ZEISS Crossbeam FIB-SEM combines the powerful imaging and analytical performance of a field emission scanning electron microscope (FE-SEM) column with the superior processing ability of a next-generation focused ion beam (FIB). It therefore enables applications like imaging & analytics, tomography as well as sample preparation & nanopatterning.
With the new Ion-sculptor FIB column you minimize sample damage and maximize sample quality – and perform experiments faster at the same time. You can customize your instrument to achieve both high quality and high throughput in TEM lamella preparation.