Tag Archives: X-ray Microscopy

Xradia by ZEISS: All things X-ray microscopy

ZEISS presents an update of LabDCT – its diffraction contrast tomography module for the ZEISS Xradia 520 Versa X-ray microscope. This imaging and analytical technique is used for obtaining crystallographic information on metal alloys or polycrystalline materials. It enables non-destructive mapping of orientation and microstructure. With LabDCT, ZEISS takes diffraction contrast tomography out of the exclusive realm of the synchrotron and extends it right into the researcher’s laboratory.


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A research group at the University College London is using X-ray microscopy to study the inner-workings of batteries and fuel cells

The Electrochemical Innovation Laboratory at University College London (UCL) is using microscopy to study the inner-workings of batteries and fuel cells. ZEISS Xradia 810 Ultra enables them to study the evolution of microstructure with down to 50 nm resolution, revealing the fine details of Li-ion batteries in 3D. Combined with the high penetrating power and sub-micron resolution of ZEISS Xradia 520 Versa, the research team at UCL is able to achieve multi-scale results, relating large features in the package to the complex pore pathways within the electrode layers and separators.


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Lectures, lunch and a visit to the μCT lab at the ESE department at Imperial College London included

Together with ZEISS the Imperial College London is offering a free short course on 14 September 2017, which introduces participants to micro-computed tomography (micro-CT) as a basic tool for experimental research in porous media.

Included are lectures and a visit to the micro-CT lab at the Department of Earth Science and Engineering of the Imperial College London.


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Linking pore topography and topology using nanoscale 3D FIB-SEM and FIB-HIM imaging

In this webinar we will overview all the methodological requirements which lie behind producing high fidelity nano-scale images, before looking at how these techniques can be used to understand the differences between organic hosted pore structures seen in onshore economic US shale reservoirs and those seen in more conventional pore structures.

When: September 6th, 2017, 9:00 AM – 10:00 AM PST


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ZEISS & Wiley present free guide

This Essential Knowledge Briefing aims to provide a simple introduction to correlative microscopy. It describes the different microscopy techniques that are commonly combined together, outlines the benefits and challenges of these different combinations, and explores how correlative microscopy will develop and advance in the future.


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Combine multiple imaging technologies from ZEISS and gain new perspectives on your sample

Microscopy is so much more than simply making small things visible. With different microscopy techniques, you can observe living cells in motion, collect three-dimensional measurements, identify chemical elements, count tiny particles, characterize surfaces, create nano structures, and look into the smallest objects without destroying them.


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Join ZEISS for our largest microscopy tradeshow in North America. Visit us at the 2017 Microscopy & Microanalysis conference to learn about the latest microscopy innovations and advancements through seminars in our booth. Test-drive our newest electron/ion and light microscopes. Challenge our team of experts with your most difficult imaging problems.


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Two stands and three days filled with workshops and demonstrations

ZEISS attended this year’s Microscience Microscopy Congress (MMC) – a three day bi-annual exhibition held in Manchester and the largest of its kind in Europe. Over a hundred companies attend MMC, giving delegates the chance to get hands-on with of the latest microscopy equipment.


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Spotlight on the customer

Asia, America and Europe: Eight ZEISS Microscopy Customer Centers strategically
located around the globe offer the customer a perfect insight into the ZEISS Microscopy
portfolio extending from light, electron and ion microscopes to X-ray microscopes.
More than 150 customer demonstrations are performed every month all over the
world. Every month around 50 customers attend in-house training, user meetings and
workshops focused on the subject of microscopy.


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Phase Contrast Tomography for Quantitative Analysis

Contemporary high performance structural materials like hypereutectic Al-Si alloy is an attractive class of engineering material that finds application in many critical electronic purposes.  Researchers at Naval Materials Research Laboratory (NMRL) in India used a novel approach of friction stir processing (FSP), a variant of severe plastic deformation process, for microstructural refinement.  In an international collaboration between the NMRL and ZEISS Microscopy, non-destructive three dimensional X-ray imaging, performed with ZEISS Xradia 520 Versa was used to investigate the microstructural modifications obtained by FSP on the Al-30Si alloy.


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