Tag Archives: Machine Learning

Introducing ZEISS ZEN Intellesis: Machine learning for microscopy

Bringing our customers new solutions through digitalization

By adding robust new capabilities like machine learning to our microscopy systems, we are initiating a step-change in the way our customers in industry and academia manage and process vast amounts of imaging data generated by a range of imaging modalities. This enables them to easily and intelligently obtain scalable, quantitative insight.

The first algorithmic solution introduced by the ZEISS ZEN Intellesis platform makes integrated, easy to use, powerful segmentation for 2D and 3D datasets available to the routine microscopy user. ZEISS ZEN Intellesis software is available for the company’s full range of optical, confocal, X-ray, electron and ion microscopes using the ZEISS Efficient Navigation (ZEN) platform.


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