Tag Archives: Electron and Ion Microscopy

All things electron & ion microscopy

Inspiring ZEISS ORION NanoFab’s community with another local Orion’s mission

The 2nd North American Helium Ion Microscopy User Meeting was held June 2-3, 2017 in Orlando, FL, at the successful conclusion of the 61st Electron, Ion, and Photon Beam Technology and NanoFabrication (EIPBN) Conference, also known as ‘3 Beams’.  EIPBN featured 14 oral presentations and posters highlighting research performed using ZEISS ORION NanoFab.


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The global partnership will advance biomedical imaging technologies

ZEISS will collaborate with Salk’s Waitt Advanced Biophotonics Center scientists to receive critical feedback on challenging imaging needs to further push the boundaries of imaging technologies to new frontiers. In the future, the partnership will reach full force as the Waitt Center collaborates with ZEISS to develop, test, optimize and perform next-generation biological imaging experiments with alpha and beta versions of hardware and software for everything from high-speed 4D fluorescence imaging to cryo-correlative fluorescence and electron microscopy.


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Structured nanocrystals revealed for the first time

Tiny, individual crystals on the underside of a Mexican butterfly’s wings give the insect a distinctive green color that allows it to hide from predators. Researchers at the University of Fribourg’s Adolphe Merkle Institute (AMI), the Karlsruhe Institute of Technology (KIT), the University of Erlangen-Nuremberg (FAU) in Germany, and Murdoch University in Western Australia, have shown for the first time how these crystals might grow.


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Experience correlative and advanced 3D microscopy

On 24 April 2017 ZEISS opened the new ZEISS Microscopy Customer Center Europe at the Oberkochen site. This is the most comprehensive ZEISS Customer Center including light, electron and X-ray microscopy in a single location: here users from Industry and Academia can try out correlative workflows between the different microscopy technologies and also advanced 3D microscopy.


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Imaging of cathode, anode, binder, separator at low accelerating voltages with ZEISS FE-SEM instruments

Rechargeable Li-ion batteries are the power source of choice for portable electronic devices such as cellphones, laptops, cameras, etc. and are becoming increasingly important in the automotive industry and for stationary storage applications. They are complex electrochemical energy storage devices incorporating many material types, ranging from high-density metals to low-density polymers, and require a flexible suite of instrumentation for proper characterization & analysis. Especially challenging are charging effects and the danger of damage on some sensitive components when using higher accelerating voltages in the electron microscope. In this application note, very low voltage imaging was used to investigate the usability of a scanning electron microscope (SEM) on battery materials. The surface and binder of cathode and anode as well as the separator were analyzed.


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Enhanced resolution and faster FIB material processing for maximum efficiency

ZEISS presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) for high-end applications in research and industry. ZEISS Crossbeam 550 features a significant increase in resolution for imaging and material characterization and a speed gain in sample preparation. Nanostructures such as composites, metals, biomaterials or semiconductors can be investigated with analytical and imaging methods in parallel. ZEISS Crossbeam 550 allows simultaneous modification and monitoring of samples, resulting in fast sample preparation and high throughput e.g. for cross-sectioning, TEM lamella preparation or nano-patterning.


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New partnership strengthens global sales activities for unique ZEISS ORION NanoFab platform

The Microscopy business group of ZEISS and the Raith Group agreed to unite their sales and promotional activities for ZEISS ORION NanoFab, the only helium-ion-microscope in the world. ORION NanoFab fabricates sub-10 nm structures and images at 0.5 nm. Combined with a focused ion beam it enables machining with gallium, neon or helium beams and covers the complete range from micro- to nanomachining.


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Cambridge scientists trace fly neurons with ZEISS correlative 3D electron and X-ray microscopy

The brain is an interconnected network of specialized, electrically active cells called neurons. A new area of neuroscience, called connectomics, aims to describe the complete set of connections between cells within and between brain areas. This is important as it allows neuroscientists to decipher the ‘circuit logic’ of how information is processed by the brain and linked to behaviors. This is critically relevant to the research and therapeutic strategies in the treatment of human brain disorders and mental health, as disruptions in information processing often affects learning, memory and thought processes. These disruptions can occur at the junctions where neurons connect, called synapses.


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New Center for 4D Materials Science a collaboration between Arizona State University, ZEISS, and US Office of Naval Research

A new research center, devoted to studying the structure of advanced, high-performance materials in three dimensions was established within the Ira A. Fulton Schools of Engineering earlier this month. Headed by Nik Chawla, Fulton Professor of Materials Science and Engineering and funded by a collaboration between Arizona State University, ZEISS Microscopy and the US Office of Naval Research, the Center for 4D Materials Science, or 4DMS, provides a unique and ground-breaking dimension to materials research — time.


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