Tag Archives: Electron and Ion Microscopy

All things electron & ion microscopy

Free workshop and scientific meeting on Correlative Microscopy: From 3D Light to 3D Electron Microscopy

ZEISS in Collaboration with VIB | 4th Meeting

ZEISS in collaboration with the BioImaging Core Facility at the VIB Ghent are proud to host this joint workshop and scientific meeting on Correlative Microscopy and volume SEM. The meeting is centered around scientific sessions covering a broad range of correlative microscopy and SEM methods including data management and analysis. In addition participants will have the opportunity to join instrument workshops and round table discussions.


New field emission scanning electron microscope ZEISS GeminiSEM 450 introduced

Addressing the highest demands in imaging and analytics from any sample

With the field emission scanning electron microscope ZEISS GeminiSEM 450, you benefit from high resolution and surface sensitive imaging. The optical system supports supports your work in obtaining the best analytical results – especially when working with low voltages. High-throughput electron backscatter diffraction (EBSD) analysis and low voltage X-ray spectroscopy (EDS) deliver excellent results due to ZEISS Gemini 450’s ability to precisely and independently control spot size and beam current. With the Gemini 2 design, you always work under optimized conditions as the system allows to switch seamlessly between imaging and analytical modes at the touch of a button. This makes ZEISS GeminiSEM 450 the ideal platform for the highest demands in imaging and analytical performance.


New Focal Charge Compensation mode improves image quality of ZEISS field emission scanning electron microscopes

Now enabling fast acquisition rates and minimal sample damage for high resolution 3D block face imaging of biological samples

In collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face imaging with ZEISS GeminiSEM and 3View® from Gatan, Inc. Focal Charge Compensation expands versatility and considerably increases data quality without prolonging acquisition times. It enables easy imaging of even the most charge prone samples. Resin embedded tissues and cells can now be imaged without charging artifacts, while the pixel dwell time is reduced. Decreasing beam exposure time ensures fast acquisition rates and  guards against sample damage. This is key to acquire reliable and reproducible 3D data.


New generation of ZEISS EVO scanning electron microscope introduced

Modular platform for intuitive operation, routine investigations and research applications

ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of available options, the ZEISS EVO family can be tailored precisely to requirements in life sciences, material sciences, or routine industrial quality assurance.


Microscopic studies of ancient concrete could teach us to do as the Romans did

Many Roman concrete structures still stand strong today. It has long puzzled scientists as to how they remain intact more than 2000 years later, whether fully immersed in seawater or partly immersed in shoreline environments. And not only have these structures stood the test of time, they have even become stronger. With the help of ZEISS EVO and MERLIN Compact, a group of scientists based in China, Italy and the US have discovered the secret ingredient that could revolutionize the way concrete is manufactured today.


ZEISS MultiSEM is among the Top 5 projects of the Deutscher Zukunftspreis 2017

ZEISS MultiSEM equally benefits the field of brain research and the semiconductor industry

ZEISS MultiSEM is among the Top 5 projects of the Deutscher Zukunftspreis 2017. The prize for technology and innovation is awarded by the German president and honors excellent scientific innovations that also have economic potential and create jobs. While in a conventional scanning electron microscope only a single electron beam captures the sample, ZEISS MultiSEM uses up to 91 parallel rays – the only microscope in the world to do so. This results in an extremely high capture speed and reduces the data acquisition time for biological samples from several years to a matter of months. As a result, ZEISS MultiSEM is the world’s fastest electron microscope.


Free short course: Introduction to Micro-Computed Tomography

Lectures, lunch and a visit to the μCT lab at the ESE department at Imperial College London included

Together with ZEISS the Imperial College London is offering a free short course on 14 September 2017, which introduces participants to micro-computed tomography (micro-CT) as a basic tool for experimental research in porous media.

Included are lectures and a visit to the micro-CT lab at the Department of Earth Science and Engineering of the Imperial College London.


Helium ions image bacteria-attacking virus

ZEISS ORION NanoFab contributes to publication in Advanced Biosystems

Helium ions have been used to image viruses attacking bacteria. These bacteriophages viruses represent a possible alternative to antibiotics for treating bacterial infections.

A team from the University of Jyväskylä in Finland has turned to helium ion microscopy. With the help of ZEISS ORION NanoFab they were able to produce high-resolution images of bacteriophages–bacteria interactions at different stages of infection, and also demonstrated the feasibility of using neon and helium milling techniques to reveal subsurface structures.