New Focal Charge Compensation mode improves image quality of ZEISS field emission scanning electron microscopes
Now enabling fast acquisition rates and minimal sample damage for high resolution 3D block face imaging of biological samples
In collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face imaging with ZEISS GeminiSEM and 3View® from Gatan, Inc. Focal Charge Compensation expands versatility and considerably increases data quality without prolonging acquisition times. It enables easy imaging of even the most charge prone samples. Resin embedded tissues and cells can now be imaged without charging artifacts, while the pixel dwell time is reduced. Decreasing beam exposure time ensures fast acquisition rates and guards against sample damage. This is key to acquire reliable and reproducible 3D data.