Tag Archives: Electron and Ion Microscopy

All things electron & ion microscopy

ZEISS invites to Day of Microscopy in Oberkochen, Germany

Focus on the latest microscopy techniques and a wide range of applications

ZEISS will host the Day of Microscopy at the ZEISS Forum and ZEISS Microscopy Customer Centre Europe in Oberkochen on May 16 and 17, 2018. International guests from research, science and industry can expect a varied program of lectures, workshops and discussions that will give impressive applicative and technological insights into light, electron and X-ray microscopy at ZEISS. Keynotes from science and industry will take you into the world of tomorrow to demonstrate the broad scope of microscopy.


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Official Opening of the APAC Support Center in Shanghai

Supporting customers in the Asia-Pacific region

The opening of the ZEISS Microscopy APAC Support Center (ASC) in Shanghai is another milestone for ZEISS Microscopy to enable and support customers in the increasingly important and growing APAC region. “We can only ensure sustainable growth if we’re in a position to deliver the services our customers need quickly and effectively,” says Alex Cheong, Regional Service Manager APAC for ZEISS Microscopy.


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Describing a new species using light and scanning electron microscopy

Oberonia aureolabris – a new addition to the world of orchids

Daniel L. Geiger, Curator of Malacology at the Santa Barbara Museum of Natural History, recently discovered and named a new orchid species. In addition to macrophotography, he used light, stereo and electron microscopes from ZEISS. One of the distinguishing characteristics is the golden-orange color of the flower. And that is how he came up with the name for the species: ‘aureo’ (Latin for golden) and ’labris’ (Latin for lip): Oberonia aureolabris.


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Reconstructing brain circuits

A carbon nanotube coated tape for serial-section electron microscopy

An international research team centered at Japan’s National Institute for Physiological Sciences with German Max Planck Institute and ZEISS Microscopy developed a carbon nanotube tape for facilitating serial-section electron microscopy used for reconstructing brain circuits. The superior properties of the described tape enable even larger-scale imaging projects – as imaging becomes more reliable and image quality is improved. In particular high-throughput imaging devices such as ZEISS MultiSEM benefit from this recent development.

 


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World Cancer Day

Cancer research - ZEISS microscopes provide insights into how cancer proliferates

In cancer research, scientists often use ZEISS microscopes to understand how healthy cells are different to cancer cells. Live cell imaging helps to monitor the dynamic processes in the cell cycle and is often used in cell or animal models. Autofluorescence or fluorescent labels help to distinguish tumor cells and tissue from healthy cells. Such basic research is the very foundation for the development of novel diagnoses, treatments, and cures.


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Free workshop and scientific meeting on Correlative Microscopy: From 3D Light to 3D Electron Microscopy

ZEISS in Collaboration with VIB | 4th Meeting

ZEISS in collaboration with the BioImaging Core Facility at the VIB Ghent are proud to host this joint workshop and scientific meeting on Correlative Microscopy and volume SEM. The meeting is centered around scientific sessions covering a broad range of correlative microscopy and SEM methods including data management and analysis. In addition participants will have the opportunity to join instrument workshops and round table discussions.


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New field emission scanning electron microscope ZEISS GeminiSEM 450 introduced

Addressing the highest demands in imaging and analytics from any sample

With the field emission scanning electron microscope ZEISS GeminiSEM 450, you benefit from high resolution and surface sensitive imaging. The optical system supports supports your work in obtaining the best analytical results – especially when working with low voltages. High-throughput electron backscatter diffraction (EBSD) analysis and low voltage X-ray spectroscopy (EDS) deliver excellent results due to ZEISS Gemini 450’s ability to precisely and independently control spot size and beam current. With the Gemini 2 design, you always work under optimized conditions as the system allows to switch seamlessly between imaging and analytical modes at the touch of a button. This makes ZEISS GeminiSEM 450 the ideal platform for the highest demands in imaging and analytical performance.


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New Focal Charge Compensation mode improves image quality of ZEISS field emission scanning electron microscopes

Now enabling fast acquisition rates and minimal sample damage for high resolution 3D block face imaging of biological samples

In collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face imaging with ZEISS GeminiSEM and 3View® from Gatan, Inc. Focal Charge Compensation expands versatility and considerably increases data quality without prolonging acquisition times. It enables easy imaging of even the most charge prone samples. Resin embedded tissues and cells can now be imaged without charging artifacts, while the pixel dwell time is reduced. Decreasing beam exposure time ensures fast acquisition rates and  guards against sample damage. This is key to acquire reliable and reproducible 3D data.


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New generation of ZEISS EVO scanning electron microscope introduced

Modular platform for intuitive operation, routine investigations and research applications

ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of available options, the ZEISS EVO family can be tailored precisely to requirements in life sciences, material sciences, or routine industrial quality assurance.


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