ZEISS presents Digital Classroom Experience at 11th Asia Pacific Microscopy Conference
At the 11th Asia Pacific Microscopy Conference in Phuket, Thailand, held from 24 – 27 May, ZEISS presented the “Digital Classroom Experience Zone” and organized scientific talks on confocal, focused ion beam, and helium ion microscopy by ZEISS experts. In addition, visitors at the ZEISS booth had the opportunity to explore virtual reality with a ZEISS VR ONE Virtual Reality Headset.
In the Digital Classroom Experience Zone the visitors discovered a modern, interactive way of microscopy teaching: by taking advantage of the multi-observation possibilities to convey subject matter to students with different specimens. The observed image is simultaneously presented via an HD projector and on the student’s individual mobile tablet or smartphone. This way, students can check the image details on their own display while listening to the teacher’s explanation. After the lesson the teacher shares images via the internal facility network, or by using email or various chat programs. Students share material via the internet when they submit their assignments, or share their best imaging with their friends and family on social networks.
The Digital Classroom Experience was accompanied by a scientific talk about digital transformation in microscopy teaching by Dr. Peter Kraemer, Head of Segment Marketing for Education and Routine. “We kickstarted our digital classroom initiative for South East Asia at APMC. We will follow this up by going to multiple sites in South East Asia with a mobile “Digital Classroom Experience Zone” – a setup of our digital classroom portfolio. The idea is to provide an experiential opportunity, which we believe is the key way of promoting the digital classroom to the educational community in the Asia-Pacific region,” said Vybhav Sinha, Sales Marketing Manager, Asia Pacific.
Besides Digital Classroom, ZEISS held multiple scientific talks at APMC including confocal superresolution with ZEISS Airyscan and the new Fast Mode, multi-ion beam technology with ZEISS ORION Nanofab, and scanning electron microscopy with integrated Raman spectrometers.