Addressing the highest demands in imaging and analytics from any sample

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The new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450 combines ultrahigh resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use.

A field emission scanning electron microscope for highest demands in imaging and analytical performance

With ZEISS GeminiSEM 450, you benefit from high resolution, surface sensitive imaging and an optical system that ideally supports your experiments in obtaining the best analytical results – especially when working with low voltages. High-throughput electron backscatter diffraction (EBSD) analysis and low voltage X-ray spectroscopy (EDS) deliver excellent results due to ZEISS Gemini 450’s ability to precisely and independently control spot size and beam current. With the Gemini 2 design, it is possible to always work under optimized conditions as the system can switch seamlessly between imaging and analytical modes at the touch of a button. This makes the field emission scanning electron microscope ZEISS GeminiSEM 450 the ideal platform for the highest demands in imaging and analytical performance.

Metal foams like this open cell nickel foam are widely used as cathode substrate in batteries or super-capacitors. This highly topographic foam is characterized with large depth of focus (DOF) using the Inlens SE detector of ZEISS GeminiSEM 450 at 8 kV.

Designed to cater for a broad variety of sample types

In addition, ZEISS GeminiSEM 450 caters for a broad variety of sample types from classical conductive metals to beam sensitive polymers. In particular the variable pressure technology of ZEISS GeminiSEM 450 reduces charging on non-conductive samples without compromising Inlens detection capabilities. At the same time it enables high resolution EDS analysis by minimizing the skirt effect. The instrument is suited to a broad variety of applications in materials science, industrial labs and life sciences.

EBSD analysis of a cross-section of a Canadian coin at 20 kV and 5 nA. The total characterization of 185 thousand points takes just 20 minutes. The field emission scanning electron microscope ZEISS GeminiSEM 450 lets you achieve high current and high density simultaneously.

“With ZEISS GeminiSEM 450 we have introduced a new FE-SEM flagship for highest performance analytics and ultrahigh resolution. In addition to this product launch, we are also rolling out significant enhancements to both the ZEISS GeminiSEM and ZEISS Sigma families. As an example, the ZEISS Sigma family now benefits from the introduction of the high resolution gun mode that has previously only been available on the ZEISS Gemini series” says Dr. Michael Albiez, head of electron microscopy at ZEISS.

More information on the ZEISS GeminiSEM field emission scanning electron microscope

Tags: Electron and Ion Microscopy

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