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Free workshop and scientific meeting on Correlative Microscopy: From 3D Light to 3D Electron Microscopy

ZEISS in Collaboration with VIB | 4th Meeting

ZEISS in collaboration with the BioImaging Core Facility at the VIB Ghent are proud to host this joint workshop and scientific meeting on Correlative Microscopy and volume SEM. The meeting is centered around scientific sessions covering a broad range of correlative microscopy and SEM methods including data management and analysis. In addition participants will have the opportunity to join instrument workshops and round table discussions.


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Supporting the fight against tuberculosis

ZEISS is again preferred supplier for the initiative "STOP TB"

ZEISS has now been appointed for the second time as the preferred supplier of tuberculosis microscopy products for the initiative “STOP TB” aimed at fighting tuberculosis. The Initiative of the United Nations Office for Project Services, or UNOPS in short, signed the agreement for the next three years.


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Introducing ZEISS ZEN Intellesis: Machine learning for microscopy

Bringing our customers new solutions through digitalization

By adding robust new capabilities like machine learning to our microscopy systems, we are initiating a step-change in the way our customers in industry and academia manage and process vast amounts of imaging data generated by a range of imaging modalities. This enables them to easily and intelligently obtain scalable, quantitative insight.

The first algorithmic solution introduced by the ZEISS ZEN Intellesis platform makes integrated, easy to use, powerful segmentation for 2D and 3D datasets available to the routine microscopy user. ZEISS ZEN Intellesis software is available for the company’s full range of optical, confocal, X-ray, electron and ion microscopes using the ZEISS Efficient Navigation (ZEN) platform.


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New field emission scanning electron microscope ZEISS GeminiSEM 450 introduced

Addressing the highest demands in imaging and analytics from any sample

With the field emission scanning electron microscope ZEISS GeminiSEM 450, you benefit from high resolution and surface sensitive imaging. The optical system supports supports your work in obtaining the best analytical results – especially when working with low voltages. High-throughput electron backscatter diffraction (EBSD) analysis and low voltage X-ray spectroscopy (EDS) deliver excellent results due to ZEISS Gemini 450’s ability to precisely and independently control spot size and beam current. With the Gemini 2 design, you always work under optimized conditions as the system allows to switch seamlessly between imaging and analytical modes at the touch of a button. This makes ZEISS GeminiSEM 450 the ideal platform for the highest demands in imaging and analytical performance.


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Cell Reports Focus: Brain Imaging

ZEISS & Cell Press present focus issue that celebrates the power of modern imaging to reveal new insights into the architecture and operation of nervous systems

The topics in this Cell focus issue on brain imaging range from the molecular framework of axons to the large-scale organization of whole brains.


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Inauguration of ZEISS Xradia Ultra X-ray microscope

Center of Nanoanalysis and Electron Microscopy (CENEM) at the Friedrich-Alexander-University Erlangen-Nuremberg delighted with new research tool

The Center of Nanoanalysis and Electron Microscopy at the Friedrich-Alexander-University Erlangen-Nuremberg recently opened its doors for the inauguration of their new ZEISS Xradia Ultra X-ray microscope.


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Practical experiments for education in biology

University of Jena and ZEISS publish microscopy tutoring for students and prospective teachers

Together with the Friedrich Schiller University Jena, Germany, ZEISS has put together a microscopy manual for students and (future) teachers. The booklet contains practical experiments for education in biology. The English version is now available free of charge.


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New 2D Superresolution mode for ZEISS Airyscan delivers 120 nanometer lateral resolution

Improved optical sectioning brings higher resolution without acquiring a z-stack

At Neuroscience 2017, a new processing mode for the ZEISS LSM 8 family with Airyscan has been introduced. ZEISS Airyscan allows for the unique combination of superresolution imaging with increased sensitivity and acquisition speed. It works with standard samples and dyes, and captures 3D data even in thicker samples that need a higher penetration depth. The unique 32-channel GaAsP array detector captures more spatial information than traditional confocal microscopes. The new 2D Superresolution mode now uses this additional information to create an optical section of 0.2 Airy units (AU) and resolves structures down to 120 nanometer laterally in a single image.


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New Focal Charge Compensation mode improves image quality of ZEISS field emission scanning electron microscopes

Now enabling fast acquisition rates and minimal sample damage for high resolution 3D block face imaging of biological samples

In collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face imaging with ZEISS GeminiSEM and 3View® from Gatan, Inc. Focal Charge Compensation expands versatility and considerably increases data quality without prolonging acquisition times. It enables easy imaging of even the most charge prone samples. Resin embedded tissues and cells can now be imaged without charging artifacts, while the pixel dwell time is reduced. Decreasing beam exposure time ensures fast acquisition rates and  guards against sample damage. This is key to acquire reliable and reproducible 3D data.


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New generation of ZEISS EVO scanning electron microscope introduced

Modular platform for intuitive operation, routine investigations and research applications

ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of available options, the ZEISS EVO family can be tailored precisely to requirements in life sciences, material sciences, or routine industrial quality assurance.


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