Microscopy News Blog

All the news from ZEISS Microscopy

Now enabling fast acquisition rates and minimal sample damage for high resolution 3D block face imaging of biological samples

News

In collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face imaging with ZEISS GeminiSEM and 3View® from Gatan, Inc. Focal Charge Compensation expands versatility and considerably increases data quality without prolonging acquisition times. It enables easy imaging of even the most charge prone samples. Resin embedded tissues and cells can now be imaged without charging artifacts, while the pixel dwell time is reduced. Decreasing beam exposure time ensures fast acquisition rates and  guards against sample damage. This is key to acquire reliable and reproducible 3D data.

More information on ZEISS 3View® and Focal Charge Compensation

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Tags: Electron and Ion Microscopy

Modular platform for intuitive operation, routine investigations and research applications

News

ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of available options, the ZEISS EVO family can be tailored precisely to requirements in life sciences, material sciences, or routine industrial quality assurance.

More information on the ZEISS EVO product family

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Tags: Electron and Ion Microscopy

News

ZEISS presents an update of LabDCT – its diffraction contrast tomography module for the ZEISS Xradia 520 Versa X-ray microscope. This imaging and analytical technique is used for obtaining crystallographic information on metal alloys or polycrystalline materials. It enables non-destructive mapping of orientation and microstructure. With LabDCT, ZEISS takes diffraction contrast tomography out of the exclusive realm of the synchrotron and extends it right into the researcher’s laboratory.

More information on ZEISS Xradia 520 Versa and LabDCT

Discover how LabDCT works

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Tags: X-ray Microscopy

Customer Story

Knowledge

Many Roman concrete structures still stand strong today. It has long puzzled scientists as to how they remain intact more than 2000 years later, whether fully immersed in seawater or partly immersed in shoreline environments. And not only have these structures stood the test of time, they have even become stronger. With the help of ZEISS EVO and MERLIN Compact, a group of scientists based in China, Italy and the US have discovered the secret ingredient that could revolutionize the way concrete is manufactured today.

More information on ZEISS EVO for materials

More information on ZEISS MERLIN

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Tags: Electron and Ion Microscopy

Events

When participating on this webinar, you will understand:

  • The fully integrated FESEM/AFM solution and its unique features
  • When to do in situ combination of FESEM and AFM?
  • What additional information you will get from the combination compared to standalone systems
  • How to work with the instrument

Register here for free

Learn more about the ZEISS GeminiSEM FE-SEM Family

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Tags: Electron and Ion Microscopy

A research group at the University College London is using X-ray microscopy to study the inner-workings of batteries and fuel cells

Customer Story

The Electrochemical Innovation Laboratory at University College London (UCL) is using microscopy to study the inner-workings of batteries and fuel cells. ZEISS Xradia 810 Ultra enables them to study the evolution of microstructure with down to 50 nm resolution, revealing the fine details of Li-ion batteries in 3D. Combined with the high penetrating power and sub-micron resolution of ZEISS Xradia 520 Versa, the research team at UCL is able to achieve multi-scale results, relating large features in the package to the complex pore pathways within the electrode layers and separators.

Find out more on ZEISS X-ray microscopy

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Tags: X-ray Microscopy

ZEISS MultiSEM equally benefits the field of brain research and the semiconductor industry

News

ZEISS MultiSEM is among the Top 5 projects of the Deutscher Zukunftspreis 2017. The prize for technology and innovation is awarded by the German president and honors excellent scientific innovations that also have economic potential and create jobs. While in a conventional scanning electron microscope only a single electron beam captures the sample, ZEISS MultiSEM uses up to 91 parallel rays – the only microscope in the world to do so. This results in an extremely high capture speed and reduces the data acquisition time for biological samples from several years to a matter of months. As a result, ZEISS MultiSEM is the world’s fastest electron microscope.

More information on ZEISS MultiSEM

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Tags: Electron and Ion Microscopy

Lectures, lunch and a visit to the μCT lab at the ESE department at Imperial College London included

News

Together with ZEISS the Imperial College London is offering a free short course on 14 September 2017, which introduces participants to micro-computed tomography (micro-CT) as a basic tool for experimental research in porous media.

Included are lectures and a visit to the micro-CT lab at the Department of Earth Science and Engineering of the Imperial College London.

Register here for free

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Tags: Correlative Microscopy, Electron and Ion Microscopy, X-ray Microscopy