Microscopy News Blog

All the news from ZEISS Microscopy

Experience correlative and advanced 3D microscopy

News

On 24 April 2017 ZEISS opened the new ZEISS Microscopy Customer Center Europe at the Oberkochen site. This is the most comprehensive ZEISS Customer Center including light, electron and X-ray microscopy in a single location: here users from Industry and Academia can try out correlative workflows between the different microscopy technologies and also advanced 3D microscopy.

More information and registration

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Tags: Airyscan, Confocal Microscopy, Correlative Microscopy, Digital Classroom, Digital Microscopy, Electron and Ion Microscopy, Light Microscopy, Light sheet Microscopy, Software & Digital Imaging, Super-resolution Microscopy, X-ray Microscopy

Knowledge

The Journal of Visualized Experiments (JoVE) is a PubMed-indexed video journal with the mission to increase the productivity of scientific research. Our article features a detailed video protocol for live confocal imaging of developing Arabidopsis flowers with ZEISS stereo and laser scanning microscopy systems. Enjoy the video protocol and let yourself be inspired!

Tags: Confocal Microscopy, Light Microscopy, Software & Digital Imaging

Carl R. Woese Institute for Genomic Biology becomes first ZEISS labs@location partner in North America

Customer Story

A new agreement between the Carl R. Woese Institute for Genomic Biology (IGB) at the University of Illinois at Urbana-Champaign and ZEISS has named the Core Facilities at IGB as an official ZEISS labs@location Partner. The model facility will allow researchers from around the U.S. to test-drive new instruments in the IGB’s Core Facilities Microscopy Suite. This partnership represents the first North American location of the ZEISS labs@location partner program, already in use across Europe.

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Tags: Confocal Microscopy, Light Microscopy, Light sheet Microscopy

ZEISS at The Big Bang Fair 2017

News

For the first time ever, ZEISS attended the UK Big Bang Young Scientists & Engineers Fair at Birmingham NEC presenting digital classroom solutions. This is the largest celebration of science, technology, engineering and maths (STEM) for young people in the UK.

The Big Bang Science Fair helped ZEISS to demonstrate to teachers how a Digital Classroom setup can help them to revolutionise the learning and teaching of STEM subjects for our scientists of tomorrow. Tom Quick from ZEISS UK commented: “The show was a fantastic experience for all involved at ZEISS, and it was extremely rewarding to see the children get so excited about science under a microscope.”

Click here to learn more about the ZEISS Digital Classroom solution

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Tags: Digital Classroom, Light Microscopy

ZEISS on Your Campus microscopy workshop series is visiting the UK in 2017

Campus

ZEISS Microscopy UK recently kicked off its Life Science Imaging workshops giving microscope users the chance to redefine how they use the latest technology from ZEISS. The day consisted of short but focused talks and hands-on interactive workshops. The sessions provided an overview of the new ZEISS Celldiscoverer 7, Fast Mode for LSM 880 with Airyscan, the recently updated Axio Observer family of inverted research microscopes, and electron microscopy for life sciences with ZEISS Atlas 5. ZEISS experts were on-hand to discuss how the systems can be used to their full potential and demonstrated correlative 3D microscopy solutions from light toelectron/ion and X-ray microscopy.

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Tags: Airyscan, Confocal Microscopy, Light Microscopy, Light sheet Microscopy, Software & Digital Imaging

Imaging of cathode, anode, binder, separator at low accelerating voltages with ZEISS FE-SEM instruments

Knowledge

Rechargeable Li-ion batteries are the power source of choice for portable electronic devices such as cellphones, laptops, cameras, etc. and are becoming increasingly important in the automotive industry and for stationary storage applications. They are complex electrochemical energy storage devices incorporating many material types, ranging from high-density metals to low-density polymers, and require a flexible suite of instrumentation for proper characterization & analysis. Especially challenging are charging effects and the danger of damage on some sensitive components when using higher accelerating voltages in the electron microscope. In this application note, very low voltage imaging was used to investigate the usability of a scanning electron microscope (SEM) on battery materials. The surface and binder of cathode and anode as well as the separator were analyzed.

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Tags: Electron and Ion Microscopy

Enhanced resolution and faster FIB material processing for maximum efficiency

News

ZEISS presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) for high-end applications in research and industry. ZEISS Crossbeam 550 features a significant increase in resolution for imaging and material characterization and a speed gain in sample preparation. Nanostructures such as composites, metals, biomaterials or semiconductors can be investigated with analytical and imaging methods in parallel. ZEISS Crossbeam 550 allows simultaneous modification and monitoring of samples, resulting in fast sample preparation and high throughput e.g. for cross-sectioning, TEM lamella preparation or nano-patterning.

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Tags: Correlative Microscopy, Electron and Ion Microscopy

ZEISS supports Illinois I-STEM educational outreach event with classroom microscopes

News

Taking a break from their regular classes… and the gym, on February 22nd, 63 scholar-athletes from the Urbana High School boys’ and girls’ basketball teams visited the Institute for Genomic Biology (IGB) on campus to learn about DNA sciences during I-STEM’s DNA and Health Day. While learning about DNA and Health via a number of hands-on activities, they also got to interact with some Illinois researchers. During a tour of the IGB, they got hands-on experience with state-of-the-art ZEISS microscopes and cutting-edge technology.

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Tags: Light Microscopy

New partnership strengthens global sales activities for unique ZEISS ORION NanoFab platform

News

The Microscopy business group of ZEISS and the Raith Group agreed to unite their sales and promotional activities for ZEISS ORION NanoFab, the only helium-ion-microscope in the world. ORION NanoFab fabricates sub-10 nm structures and images at 0.5 nm. Combined with a focused ion beam it enables machining with gallium, neon or helium beams and covers the complete range from micro- to nanomachining.

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Tags: Electron and Ion Microscopy