Microscopy News Blog

All the news from ZEISS Microscopy

Combine multiple imaging technologies from ZEISS and gain new perspectives on your sample

News

Microscopy is so much more than simply making small things visible. With different microscopy techniques, you can observe living cells in motion, collect three-dimensional measurements, identify chemical elements, count tiny particles, characterize surfaces, create nano structures, and look into the smallest objects without destroying them.

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Tags: Airyscan, Confocal Microscopy, Correlative Microscopy, Digital Classroom, Digital Microscopy, Electron and Ion Microscopy, Light Microscopy, Light sheet Microscopy, Software & Digital Imaging, Super-resolution Microscopy, X-ray Microscopy

Improving ease-of-use and accelerating the experimental workflow

News

WITec’s solution for correlative Raman-SEM imaging is now available for ZEISS Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed system, WITec and ZEISS have furthered their collaboration to provide a fully-integrated instrument available as an OEM product through ZEISS that features a standard, unmodified vacuum chamber and SEM column along with a complete confocal Raman microscope and spectrometer. It expands the range of choices available to the researcher and incorporates generations of experience in Raman spectroscopic imaging and advanced structural analysis.

More information on the ZEISS Sigma Family

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Tags: Correlative Microscopy, Electron and Ion Microscopy

Comparing Airyscan technology to conventional confocal imaging in live cell imaging

Knowledge

News

The recently published peer-reviewed paper “Exploring the Potential of Airyscan Microscopy for Live Cell Imaging” by Kseniya Korobchevskaya, B. Christoffer Lagerholm, Huw Colin-York  and Marco Fritzsche from the University of Oxford, UK highlights the significant improvement of resolution and signal-to-noise at the same time of ZEISS Airyscan compared to conventional confocal imaging techniques.

More information on ZEISS Airyscan

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Tags: Airyscan, Confocal Microscopy

Events

Join ZEISS for our largest microscopy tradeshow in North America. Visit us at the 2017 Microscopy & Microanalysis conference to learn about the latest microscopy innovations and advancements through seminars in our booth. Test-drive our newest electron/ion and light microscopes. Challenge our team of experts with your most difficult imaging problems.

Register today for your personal on-site instrument demo!

Register here for Lunch & Learn and our Evening Tutorials!

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Tags: Airyscan, Confocal Microscopy, Correlative Microscopy, Electron and Ion Microscopy, Light Microscopy, Software & Digital Imaging, Super-resolution Microscopy, X-ray Microscopy

Two stands and three days filled with workshops and demonstrations

News

ZEISS attended this year’s Microscience Microscopy Congress (MMC) – a three day bi-annual exhibition held in Manchester and the largest of its kind in Europe. Over a hundred companies attend MMC, giving delegates the chance to get hands-on with of the latest microscopy equipment.

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Tags: Confocal Microscopy, Digital Classroom, Electron and Ion Microscopy, Light Microscopy, X-ray Microscopy

New business unit to expand offering of collaborative, customer-driven solutions to accelerate R&D and optimize production yields

News

ZEISS is fueling its growth strategy by expanding into a new market in the semiconductor industry. Through its new Process Control Solutions (PCS) business unit, the company will leverage its core technology solutions and partnerships to address a range of special needs for semiconductor customers. The new business unit will be part of the ZEISS Semiconductor Manufacturing Technology (SMT) business group and draw on long standing innovations in Microscopy that ZEISS is well known for.

More information on the ZEISS PCS business unit

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Interactive techniques for classroom experiments and rehearsals may upgrade your university

Customer Story

Knowledge

Microscopy is an essential part of the life and earth sciences at universities. Students use microscopes to gain deeper insight into preparing and examining human, animal or plant cells. For this, they need various microscopy techniques and software for image acquisition and documentation in their lectures. And this is where the Digital Classroom comes into play: connected ZEISS microscopes, the ZEISS imaging software Labscope and digital equipment such as tablets enable an interactive approach to learning and create a motivating and engaging atmosphere for students. They are also inspired by the possibility of working with the tools they use in their everyday lives at university.

More information on the ZEISS Digital Classroom

More information on ZEISS Labscope

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Tags: Digital Classroom

Benefit from high resolution imaging at fast speeds

News

ZEISS Axiocam 305 color is the new 5 megapixel camera for high resolution imaging at fast speeds. With CMOS Global Shutter technology, users follow and capture samples accurately. They use this fast camera to acquire up to 36 frames per second at full resolution and cover more of their area of interest with its 2/3” sensor format.

More information on ZEISS Axiocam 305 color

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Tags: Light Microscopy

Spotlight on the customer

News

Asia, America and Europe: Eight ZEISS Microscopy Customer Centers strategically
located around the globe offer the customer a perfect insight into the ZEISS Microscopy
portfolio extending from light, electron and ion microscopes to X-ray microscopes.
More than 150 customer demonstrations are performed every month all over the
world. Every month around 50 customers attend in-house training, user meetings and
workshops focused on the subject of microscopy.

More information on the ZEISS Microscopy Customer Centers

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Tags: Confocal Microscopy, Correlative Microscopy, Digital Microscopy, Electron and Ion Microscopy, Light sheet Microscopy, Software & Digital Imaging, X-ray Microscopy

Phase Contrast Tomography for Quantitative Analysis

Customer Story

Knowledge

Contemporary high performance structural materials like hypereutectic Al-Si alloy is an attractive class of engineering material that finds application in many critical electronic purposes.  Researchers at Naval Materials Research Laboratory (NMRL) in India used a novel approach of friction stir processing (FSP), a variant of severe plastic deformation process, for microstructural refinement.  In an international collaboration between the NMRL and ZEISS Microscopy, non-destructive three dimensional X-ray imaging, performed with ZEISS Xradia 520 Versa was used to investigate the microstructural modifications obtained by FSP on the Al-30Si alloy.

More information on the phase contrast capabilities of ZEISS Xradia 520 Versa and more including Laboratory Diffraction Contrast Tomography (LabDCT)

Read the full article in Microscopy & Analysis here

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Tags: X-ray Microscopy